Semiconductor strain metrology principles and applications /

Saved in:

Bibliographic Details
Main Author:	Wong, Terence K. S.
Corporate Author:	ProQuest (Firm)
Format:	Electronic eBook
Language:	English
Published:	[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Subjects:	Semiconductors > Design and construction > Materials. Compound semiconductors > Design and construction > Materials. Silicon-on-insulator technology. Electronic books.
Online Access:	Click to View
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

Click to View